ListarIC - Artículos por tema "LabVIEW"
Mostrando ítems 1-1 de 1
-
A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning
(IOAP-MDPI, 2023-01-08)Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof ...