ListarIC - Artículos por tema "Device modeling"

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Measurement-based FET analytical modeling using the nonlinear function sampling approach

Martín-Guerrero, Teresa María; Santarelli, Alberto; Gibiino, Gian Piero; Traverso, Pier Andrea; Camacho-Peñalosa, Carlos; Filicori, Fabio[et al.] (IEEE Microwave and Wireless Components Letters, 2020-12)

A novel and fast method for the measurement-based identification of an analytical FET compact model from large- signal waveforms is presented. Based on a two-tone two-port experiment, a recently published Nonlinear Function ...