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Analysis of the degradation of single–crystalline silicon modules after 21 years of operation
Piliougine, Michel; Oukaja, A; Sánchez-Friera, Paula; Petrone, Giovanni; Sánchez-Pacheco, F.J.; Spagnuolo, G; Sidrach-de-Cardona-Ortin, Mariano[et al.] (Wiley, 2021-04-19)In this paper the results of the analysis of the degradation of a set of single–crystalline silicon modules after 21 years are presented. The comparison of the main electrical parame ters and the series and of the shunt ...